Characterisation: Compositional and Structural Analysis Facilities
Access to these facilities is through the Mark Wainwright Analytical Centre UNSW
- X-ray diffraction (XRD) (powder, thin films, single crystal)
- X-ray photoelectron spectroscopy (XPS)
- UV-photoelectron spectroscopy (UPS)
- Time-of-flight Secondary ion mass spectroscopy (ToF-SIMS)
- X-ray fluorescence (XRF) (majors, trace elements, mapping)
- Spectroscopy (Raman, FTIR, UV-Vis, PL)
- Inductively coupled plasma ICP) (ICP-OES, ICP-MS, liquid chromatography)
- Nuclear magnetic resonance (NMR) (solid and liquid)
- Micro-Computed Tomography (CT)