Access to these facilities is through the Mark Wainwright Analytical Centre UNSW

• Scanning electron microscopes (SEM, standard and nano-SEM)
• Transmission electron microscopes (TEM, high-resolution, aberration corrected)
• Atomic force microscopes (AFM)
• Electron proble microanalyser (EPMA)
• Focussed ion beam milling (FIB, Ga-ion and plasma milling)